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• Debug Probes - J-Link & J-Trace
  *[[SEGGER Ozone#Automated_test_example|Automated test example]]
  16 KB (1,908 words) - 10:22, 8 May 2024
• Automated Tests with Ozone
  For the automated test example that will be shown in this article the following minimum requiremen # Load test application
  3 KB (567 words) - 11:14, 8 September 2023
• emRun
  This is the description for the test projects. The test projects have been designed to measure the performance of C library functio
  20 KB (1,808 words) - 10:13, 21 November 2022
• CDC
  We have analysed this using a hardware [[USB analyser]] and a test program which The test application checks that the received packet always has the ID of the previo
  3 KB (429 words) - 17:27, 7 April 2022
• cJTAG
  ...tands for Joint Test Action Group typically refers to a 4-pin interface to test, program and/or debug integrated circuits.
  309 bytes (46 words) - 09:31, 10 March 2023
• J-Link Nickname
  ...ale setups where there are multiple J-Links connected to a PC for testing (test farms) etc.
  2 KB (264 words) - 17:11, 7 September 2023
• Supported ST Tools
  | [[STM32CubeMonitor]] || STM32 || Free software tool to test STM32 applications at run-time
  356 bytes (42 words) - 15:00, 21 May 2024
• J-Run
  It loads an application (elf) file to the device under test, runs it, and captures the application's output. == Test Applications ==
  3 KB (388 words) - 13:30, 16 May 2024
• UM08001 J-Link / J-Trace User Guide
  ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality. ...uality" of code, as it shows how much code was executed while running in a test setup.
  92 KB (14,353 words) - 12:06, 7 March 2024
• ATSAMD specifics
  When manually toggling the reset pin (e.g. in a production test), it is necessary to pull the SWCLK/TCK pin up, before releasing nRESET:
  434 bytes (70 words) - 15:14, 15 May 2024
• J-Link RTT Viewer
  JLinkRTTViewer.exe --setwindowtitle "Test board #1234"
  21 KB (2,875 words) - 13:19, 16 May 2024
• Cortex-M Fault
  A project to test the faults is available [[:File:CortexM_FaultTest.zip|here]]. === Exception Test Application ===
  47 KB (5,096 words) - 16:57, 26 June 2023
• NXP JN5189-DK006
  ...tion board. The board supports different Upgrade boards. It can be used to test & verify QN9090 and JN5189 support.
  1 KB (169 words) - 15:15, 8 May 2024
• UM08003 JFlash
  ...e test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi | Test > Test speed || Writes data of an specified size t
  72 KB (10,586 words) - 13:00, 25 March 2024
• JTAGLoad
  ...s to be written. It is usually used if the call is made automatically by a test program. ! Start of test
  5 KB (692 words) - 14:25, 16 May 2024
• J-Link STR91x Commander
  While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. ...nk STR91x Commander can be started with different command line options for test and automation purposes.
  6 KB (914 words) - 13:19, 16 May 2024
• J-Link GDB Server
  < Arguments: test 0 1 2 arg0=4 > monitor setargs test 0 1 2 arg0=4
  63 KB (8,889 words) - 09:59, 29 November 2023
• J-Link SWO Viewer
  ...Viewer can also be controlled from the command line if used in a automated test environment etc.
  14 KB (1,669 words) - 13:20, 16 May 2024
• J-Flash SPI
  | Test > Generate test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi
  46 KB (6,807 words) - 13:18, 16 May 2024
• Embedded Studio Library IO
  * Low-overhead test to determine if stream is valid. If stream
  12 KB (1,427 words) - 13:10, 16 May 2024

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