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- For the automated test example that will be shown in this article the following minimum requiremen # Load test application3 KB (567 words) - 11:14, 8 September 2023
- This is the description for the test projects. The test projects have been designed to measure the performance of C library functio20 KB (1,808 words) - 10:13, 21 November 2022
- We have analysed this using a hardware [[USB analyser]] and a test program which The test application checks that the received packet always has the ID of the previo3 KB (429 words) - 17:27, 7 April 2022
- ...tands for Joint Test Action Group typically refers to a 4-pin interface to test, program and/or debug integrated circuits.309 bytes (46 words) - 09:31, 10 March 2023
- ...ale setups where there are multiple J-Links connected to a PC for testing (test farms) etc.2 KB (264 words) - 17:11, 7 September 2023
- It loads an application (elf) file to the device under test, runs it, and captures the application's output. == Test Applications ==3 KB (385 words) - 15:38, 29 June 2022
- ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality. ...uality" of code, as it shows how much code was executed while running in a test setup.92 KB (14,353 words) - 12:06, 7 March 2024
- When manually toggling the reset pin (e.g. in a production test), it is necessary to pull the SWCLK/TCK pin up, before releasing nRESET:405 bytes (67 words) - 17:51, 9 December 2019
- JLinkRTTViewer.exe --setwindowtitle "Test board #1234"21 KB (2,872 words) - 09:41, 4 March 2024
- A project to test the faults is available [[:File:CortexM_FaultTest.zip|here]]. === Exception Test Application ===47 KB (5,096 words) - 16:57, 26 June 2023
- ...tion board. The board supports different Upgrade boards. It can be used to test & verify QN9090 and JN5189 support.1 KB (169 words) - 15:15, 8 May 2024
- ...e test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi | Test > Test speed || Writes data of an specified size t72 KB (10,586 words) - 13:00, 25 March 2024
- ! Start of test ! End of test2 KB (323 words) - 22:06, 1 March 2021
- While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. ...nk STR91x Commander can be started with different command line options for test and automation purposes.6 KB (911 words) - 15:08, 12 May 2020
- < Arguments: test 0 1 2 arg0=4 > monitor setargs test 0 1 2 arg0=463 KB (8,889 words) - 09:59, 29 November 2023
- ...Viewer can also be controlled from the command line if used in a automated test environment etc.13 KB (1,666 words) - 15:42, 24 October 2022
- | Test > Generate test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi46 KB (6,804 words) - 10:32, 27 February 2023
- * Low-overhead test to determine if stream is valid. If stream12 KB (1,424 words) - 17:37, 1 April 2022
- ...''RTT''' ('''R'''ound '''T'''rip '''T'''ime) or by performing a throughput test using a common used protocol like TCP or UDP. Often this gets mistaken for ...nce of sending the PING-request is not of relevance for the result of this test.13 KB (2,041 words) - 10:10, 7 October 2021
- ...iously known as APEXMIC) APM32F103ZET6 evaluation board. It can be used to test & verify APM32F103xx device support.1 KB (159 words) - 15:16, 8 May 2024
