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- It can be used to test & verify MSPM0L device support.1 KB (170 words) - 15:35, 8 May 2024
- ...cribes specifics for the NXP PNEV7642A evaluation board. It can be used to test & verify [[NXP PN76 |PN76]] device support with J-Link.1 KB (166 words) - 15:35, 8 May 2024
- For large test farms or similar, it may make sense to configure the J-Links for a higher E541 bytes (93 words) - 10:21, 14 December 2022
- It can be used to test & verify NXP [[i.MXRT1060]] support.2 KB (272 words) - 15:36, 8 May 2024
- * To test the IP connection J-Link Commander from the J-Link software install folder8 KB (1,318 words) - 11:48, 25 April 2024
- ...s specifics for the HPMicro HPM6200EVK evaluation board. It can be used to test & verify HPM62xx device support.1 KB (158 words) - 14:41, 15 May 2024
- ...Flasher Hub for all connected devices — control by an automation or test computer is sometimes not easy.7 KB (1,090 words) - 08:58, 11 August 2023
- ...fics for the CVA BlueWhale CVM0118-EVK evaluation board. It can be used to test & verify CVM011x device support.1 KB (174 words) - 14:33, 10 May 2024
- ...st. It is only necessary to ''command'' the flasher. This may simplify the test program. * Configuration program does not need to be part of test controller.9 KB (1,511 words) - 17:31, 15 May 2024
- * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.4 KB (632 words) - 14:25, 10 May 2024
- == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an3 KB (521 words) - 22:52, 23 February 2024
- ...example application contains a small blinky application and can be used to test & verify flash programming functionality on the TI LP-EM-CC2340R5 evaluatio903 bytes (140 words) - 14:38, 15 May 2024
- ...specifics for the SemiDrive SD126_E3205_LQFP144_DEV_KIT. It can be used to test & verify E32xx device support.681 bytes (105 words) - 11:51, 16 May 2024
- | '''11''' || RTCK || Input || Return test clock signal from the target.<br>Some targets must synchronize the JTAG inp17 KB (2,764 words) - 11:02, 4 January 2024
- An Embedded Studio solution to test and run the examples is available: [[Media:STOP_Examples.zip|STOP Examples]26 KB (3,318 words) - 14:42, 17 August 2023
- * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.4 KB (657 words) - 14:25, 10 May 2024
- The Flasher Hub has been designed to be used in conjunction with automated test equipment (ATE).2 KB (327 words) - 15:08, 15 May 2024
- ...nal interface or handshake interface connection between the ATE (Automated Test Equipment) and the Flasher Hub, flash programming operations can be trigger16 KB (2,483 words) - 16:38, 15 May 2024
- It can be used to test & verify NXP iMX 8M Nano device support for Cortex-M7.1 KB (225 words) - 13:16, 15 May 2024
- It can be used to test & verify NXP iMX 8M Mini device support for Cortex-M4.1 KB (225 words) - 13:16, 15 May 2024