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- 40 bytes (5 words) - 11:49, 20 May 2020
- == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an3 KB (521 words) - 22:52, 23 February 2024
- This article describes specifics for the ''ESWIN EMU32VL170 TEST BRD'' evaluation board.<br> ...dded Studio project wizard and runs out-of-the-box on the ESWIN EMU32VL170 TEST BRD.<br>It is a simple Hello World sample linked into the internal flash.<b899 bytes (141 words) - 08:52, 28 September 2023
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- ! colspan="3" | Measurement and test commands <tt>SaveBin C:\Work\test.bin 0x0000000 0x100</tt>52 KB (6,653 words) - 12:04, 22 April 2024
- ...he [[#OpenOCD | OpenOCD]] paragraph and continue with [[#Test_Connection | Test Connection]]. ==== Test Connection ====8 KB (1,261 words) - 18:34, 2 November 2023
- Test if flash download on your target device works with the J-Link Commander:282 bytes (42 words) - 08:05, 14 August 2015
- == Test access port (TAP) == JTAG defines a TAP (Test access port). The TAP is a general-purpose port that can5 KB (707 words) - 09:59, 30 August 2023
- ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality, anyhow dayisy-chaining devices as via JTAG is not possible.2 KB (288 words) - 09:58, 30 August 2023
- * No debug header needs to be populated, just some test pads of the SPI signals, J-Link can be connected to via needles etc.12 KB (1,976 words) - 16:38, 10 October 2023
- HSSLogFile = C:\Test.log It may only be used by specific customers for very specific test cases that needs the cache mechanisms to be disabled.77 KB (9,842 words) - 11:00, 11 April 2024
- * Fill in the project name (eg. 'Test'). Click '''Next'''.2 KB (293 words) - 14:09, 8 October 2020
- ...f the devíce to give it a fresh start or reboot it after enabling another test mode etc.<br> ...he chip into an unexpected more, causing unpredictable behavior during the test setup.4 KB (637 words) - 11:58, 17 November 2023
- #Test if RAM is located at 0 using multiple read/write operations and testing the4 KB (527 words) - 10:43, 15 November 2019
- ...ch brings MCU into Turbo Mode. "While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. The IOs are maintained1 KB (222 words) - 10:41, 27 April 2017
- If sth. still does not work, we suggest as a first step to test if it has sth. to do with the IDE in use by checking if it works when using15 KB (2,318 words) - 15:30, 4 November 2021
- // Output test values for <Keyfile>109 KB (15,505 words) - 08:38, 25 April 2024
- == Parity Test == The following setup is used for the partiy function test:7 KB (997 words) - 11:27, 22 November 2022
- # Turn off the power supply and flip the board. There you will find SWD test points.1,009 bytes (162 words) - 10:10, 18 January 2021
- # Implement SEGGER_FL_Erase() and retry the flash download test. J-Link Commander should still report verify failed but effected flash memo ...nt SEGGER_FL_Program() and retry the flash download test. Expected result: Test reports O.K. --> Programmed successfully. If not, check SEGGER_FL_Program()24 KB (3,557 words) - 14:59, 20 November 2023
- The engineer at SEGGER can use J-Link Commander or a debugger to test and debug the new device without the need to have the device on the desk. To test whether a connection to the tunnel server can be established or not a netwo7 KB (984 words) - 16:27, 31 August 2023
- * JTAG-AP <span style="color:#a2a9b1">Joint Test Action Group- Access Port </span>7 KB (1,150 words) - 16:21, 13 July 2022
- * [[Test Farm]]2 KB (162 words) - 10:58, 23 January 2024
- *[[SEGGER Ozone#Automated_test_example|Automated test example]]16 KB (1,897 words) - 16:24, 8 February 2024
