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- ...iously known as APEXMIC) APM32F103ZET6 evaluation board. It can be used to test & verify APM32F103xx device support.1 KB (159 words) - 15:16, 8 May 2024
- * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.4 KB (587 words) - 14:25, 10 May 2024
- * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.4 KB (649 words) - 14:25, 10 May 2024
- ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.4 KB (662 words) - 14:26, 10 May 2024
- ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.4 KB (659 words) - 14:26, 10 May 2024
- | Non-Volatile Record (NVR) 4 <br> (Manufacturing Test) || 1024 || 0x00081800 - 0x00080BFF1 KB (210 words) - 11:47, 16 May 2024
- ...es specifics for the AutoChips ATC0113 evaluation board. It can be used to test & verify [[AutoChips AC7801x]] support.1 KB (147 words) - 15:18, 8 May 2024
- ...s for the Silicon Labs RS9116X-SB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.679 bytes (104 words) - 15:19, 8 May 2024
- ...s for the Silicon Labs RS9116X-DB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.679 bytes (104 words) - 15:20, 8 May 2024
- ...help users targeting functional safety up to IEC 61508 SIL2/SIL3. The self-test library can be used with embOS, embOS-MPU and embOS-Safe without any restri From the embOS perspective the ST self-test library is part of the user application code.628 bytes (96 words) - 15:34, 16 February 2021
- ...fics for the GigaDevice GD32H759I-EVAL evaluation board. It can be used to test & verify GD32H7 device support.642 bytes (98 words) - 15:20, 8 May 2024
- ...bes specifics for the Renesas EK-RA6M5 evaluation board. It can be used to test & verify [[Renesas RA6M5]] support.970 bytes (151 words) - 15:20, 8 May 2024
- | Non-Volatile Record (NVR) 7 <br> (Manufacturing Test) || 256 || 0x00080700 - 0x000807FF || {{YES}} | Non-Volatile Record (NVR) 7 <br> (Manufacturing Test) || 256 || 0x00080700 - 0x000807FF || {{YES}}4 KB (670 words) - 11:47, 16 May 2024
- ===Test & Verify functionality using J-Link Commander===4 KB (594 words) - 08:59, 9 July 2021
- ...es specifics for the Renesas FPB-RA4E1 evaluation board. It can be used to test & verify [[Renesas RA4E1]] support.974 bytes (151 words) - 15:23, 8 May 2024
- ...es specifics for the Renesas FPB-RA6E1 evaluation board. It can be used to test & verify [[Renesas RA6E1]] support.974 bytes (151 words) - 15:23, 8 May 2024
- ...nect sequence. After executing the sequence, the Cortex-M33 is executing a test loop in the SRAM. This way, the Cortex-M33 can be debugged out-of-the-box w817 bytes (122 words) - 13:30, 15 May 2024
- ...tion board. The board supports different Upgrade boards. It can be used to test & verify NXP KW45 and NXP K32W14 support.1 KB (187 words) - 15:24, 8 May 2024
- ...ribes specifics for the NXP S32K3X4EVB evaluation board. It can be used to test & verify S32K344 device support with J-Link.1 KB (195 words) - 15:24, 8 May 2024
- ...specifics for the HSXP_HK32F030M/0301M evaluation board. It can be used to test & verify HK32F03xx series device support.1,002 bytes (164 words) - 15:25, 8 May 2024