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- 40 bytes (5 words) - 11:49, 20 May 2020
- == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an3 KB (521 words) - 22:52, 23 February 2024
- This article describes specifics for the ''ESWIN EMU32VL170 TEST BRD'' evaluation board.<br> ...dded Studio project wizard and runs out-of-the-box on the ESWIN EMU32VL170 TEST BRD.<br>It is a simple Hello World sample linked into the internal flash.<b899 bytes (141 words) - 08:52, 28 September 2023
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- ! colspan="3" | Measurement and test commands <tt>SaveBin C:\Work\test.bin 0x0000000 0x100</tt>52 KB (6,653 words) - 12:04, 22 April 2024
- ...he [[#OpenOCD | OpenOCD]] paragraph and continue with [[#Test_Connection | Test Connection]]. ==== Test Connection ====8 KB (1,261 words) - 18:34, 2 November 2023
- Test if flash download on your target device works with the J-Link Commander:282 bytes (42 words) - 08:05, 14 August 2015
- == Test access port (TAP) == JTAG defines a TAP (Test access port). The TAP is a general-purpose port that can5 KB (707 words) - 09:59, 30 August 2023
- ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality, anyhow dayisy-chaining devices as via JTAG is not possible.2 KB (288 words) - 09:58, 30 August 2023
- * No debug header needs to be populated, just some test pads of the SPI signals, J-Link can be connected to via needles etc.12 KB (1,976 words) - 16:38, 10 October 2023
- HSSLogFile = C:\Test.log It may only be used by specific customers for very specific test cases that needs the cache mechanisms to be disabled.77 KB (9,842 words) - 11:00, 11 April 2024
- * Fill in the project name (eg. 'Test'). Click '''Next'''.2 KB (293 words) - 14:09, 8 October 2020
- ...f the devíce to give it a fresh start or reboot it after enabling another test mode etc.<br> ...he chip into an unexpected more, causing unpredictable behavior during the test setup.4 KB (637 words) - 11:58, 17 November 2023
- #Test if RAM is located at 0 using multiple read/write operations and testing the4 KB (530 words) - 14:22, 10 May 2024
- ...ch brings MCU into Turbo Mode. "While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. The IOs are maintained1 KB (222 words) - 10:41, 27 April 2017
- If sth. still does not work, we suggest as a first step to test if it has sth. to do with the IDE in use by checking if it works when using15 KB (2,318 words) - 15:30, 4 November 2021
- // Output test values for <Keyfile>109 KB (15,505 words) - 08:38, 25 April 2024
- == Parity Test == The following setup is used for the partiy function test:7 KB (997 words) - 11:27, 22 November 2022
- # Turn off the power supply and flip the board. There you will find SWD test points.1 KB (164 words) - 14:31, 10 May 2024
- # Implement SEGGER_FL_Erase() and retry the flash download test. J-Link Commander should still report verify failed but effected flash memo ...nt SEGGER_FL_Program() and retry the flash download test. Expected result: Test reports O.K. --> Programmed successfully. If not, check SEGGER_FL_Program()24 KB (3,557 words) - 14:59, 20 November 2023
- The engineer at SEGGER can use J-Link Commander or a debugger to test and debug the new device without the need to have the device on the desk. To test whether a connection to the tunnel server can be established or not a netwo7 KB (984 words) - 16:27, 31 August 2023
- * JTAG-AP <span style="color:#a2a9b1">Joint Test Action Group- Access Port </span>7 KB (1,150 words) - 16:21, 13 July 2022
- * [[Test Farm]]2 KB (162 words) - 10:58, 23 January 2024
- *[[SEGGER Ozone#Automated_test_example|Automated test example]]16 KB (1,908 words) - 10:22, 8 May 2024
- For the automated test example that will be shown in this article the following minimum requiremen # Load test application3 KB (567 words) - 11:14, 8 September 2023
- This is the description for the test projects. The test projects have been designed to measure the performance of C library functio20 KB (1,808 words) - 10:13, 21 November 2022
- We have analysed this using a hardware [[USB analyser]] and a test program which The test application checks that the received packet always has the ID of the previo3 KB (429 words) - 17:27, 7 April 2022
- ...tands for Joint Test Action Group typically refers to a 4-pin interface to test, program and/or debug integrated circuits.309 bytes (46 words) - 09:31, 10 March 2023
- ...ale setups where there are multiple J-Links connected to a PC for testing (test farms) etc.2 KB (264 words) - 17:11, 7 September 2023
- It loads an application (elf) file to the device under test, runs it, and captures the application's output. == Test Applications ==3 KB (385 words) - 15:38, 29 June 2022
- ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality. ...uality" of code, as it shows how much code was executed while running in a test setup.92 KB (14,353 words) - 12:06, 7 March 2024
- When manually toggling the reset pin (e.g. in a production test), it is necessary to pull the SWCLK/TCK pin up, before releasing nRESET:405 bytes (67 words) - 17:51, 9 December 2019
- JLinkRTTViewer.exe --setwindowtitle "Test board #1234"21 KB (2,872 words) - 09:41, 4 March 2024
- A project to test the faults is available [[:File:CortexM_FaultTest.zip|here]]. === Exception Test Application ===47 KB (5,096 words) - 16:57, 26 June 2023
- ...tion board. The board supports different Upgrade boards. It can be used to test & verify QN9090 and JN5189 support.1 KB (169 words) - 15:15, 8 May 2024
- ...e test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi | Test > Test speed || Writes data of an specified size t72 KB (10,586 words) - 13:00, 25 March 2024
- ! Start of test ! End of test2 KB (323 words) - 22:06, 1 March 2021
- While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. ...nk STR91x Commander can be started with different command line options for test and automation purposes.6 KB (911 words) - 15:08, 12 May 2020
- < Arguments: test 0 1 2 arg0=4 > monitor setargs test 0 1 2 arg0=463 KB (8,889 words) - 09:59, 29 November 2023
- ...Viewer can also be controlled from the command line if used in a automated test environment etc.13 KB (1,666 words) - 15:42, 24 October 2022
- | Test > Generate test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi46 KB (6,804 words) - 10:32, 27 February 2023
- * Low-overhead test to determine if stream is valid. If stream12 KB (1,424 words) - 17:37, 1 April 2022
- ...''RTT''' ('''R'''ound '''T'''rip '''T'''ime) or by performing a throughput test using a common used protocol like TCP or UDP. Often this gets mistaken for ...nce of sending the PING-request is not of relevance for the result of this test.13 KB (2,041 words) - 10:10, 7 October 2021
- ...iously known as APEXMIC) APM32F103ZET6 evaluation board. It can be used to test & verify APM32F103xx device support.1 KB (159 words) - 15:16, 8 May 2024
- * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.4 KB (587 words) - 14:25, 10 May 2024
- * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.4 KB (649 words) - 14:25, 10 May 2024
- ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.4 KB (662 words) - 14:26, 10 May 2024
- ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.4 KB (659 words) - 14:26, 10 May 2024
- | Non-Volatile Record (NVR) 4 <br> (Manufacturing Test) || 1024 || 0x00081800 - 0x00080BFF1 KB (207 words) - 09:00, 9 June 2023
- ...es specifics for the AutoChips ATC0113 evaluation board. It can be used to test & verify [[AutoChips AC7801x]] support.1 KB (147 words) - 15:18, 8 May 2024
- ...s for the Silicon Labs RS9116X-SB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.679 bytes (104 words) - 15:19, 8 May 2024
- ...s for the Silicon Labs RS9116X-DB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.679 bytes (104 words) - 15:20, 8 May 2024
- ...help users targeting functional safety up to IEC 61508 SIL2/SIL3. The self-test library can be used with embOS, embOS-MPU and embOS-Safe without any restri From the embOS perspective the ST self-test library is part of the user application code.628 bytes (96 words) - 15:34, 16 February 2021
- ...fics for the GigaDevice GD32H759I-EVAL evaluation board. It can be used to test & verify GD32H7 device support.642 bytes (98 words) - 15:20, 8 May 2024