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  • Ozone automated test example
    40 bytes (5 words) - 11:49, 20 May 2020
  • Test Farm
    == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an
    3 KB (521 words) - 22:52, 23 February 2024
  • ESWIN EMU32VL170 TEST BRD
    This article describes specifics for the ''ESWIN EMU32VL170 TEST BRD'' evaluation board.<br> ...dded Studio project wizard and runs out-of-the-box on the ESWIN EMU32VL170 TEST BRD.<br>It is a simple Hello World sample linked into the internal flash.<b
    899 bytes (141 words) - 08:52, 28 September 2023

Page text matches

  • J-Link Commander
    ! colspan="3" | Measurement and test commands <tt>SaveBin C:\Work\test.bin 0x0000000 0x100</tt>
    52 KB (6,653 words) - 12:04, 22 April 2024
  • J-Link cannot connect to the CPU
    ...he [[#OpenOCD | OpenOCD]] paragraph and continue with [[#Test_Connection | Test Connection]]. ==== Test Connection ====
    8 KB (1,261 words) - 18:34, 2 November 2023
  • Debug session does not start
    Test if flash download on your target device works with the J-Link Commander:
    282 bytes (42 words) - 08:05, 14 August 2015
  • Target Interface JTAG
    == Test access port (TAP) == JTAG defines a TAP (Test access port). The TAP is a general-purpose port that can
    5 KB (707 words) - 09:59, 30 August 2023
  • Target Interface SWD
    ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality, anyhow dayisy-chaining devices as via JTAG is not possible.
    2 KB (288 words) - 09:58, 30 August 2023
  • SPI Flash
    * No debug header needs to be populated, just some test pads of the SPI signals, J-Link can be connected to via needles etc.
    12 KB (1,976 words) - 16:38, 10 October 2023
  • J-Link Command Strings
    HSSLogFile = C:\Test.log It may only be used by specific customers for very specific test cases that needs the cache mechanisms to be disabled.
    77 KB (9,842 words) - 11:00, 11 April 2024
  • Renesas e²studio
    * Fill in the project name (eg. 'Test'). Click '''Next'''.
    2 KB (293 words) - 14:09, 8 October 2020
  • XMC4xxx series
    ...f the devíce to give it a fresh start or reboot it after enabling another test mode etc.<br> ...he chip into an unexpected more, causing unpredictable behavior during the test setup.
    4 KB (637 words) - 11:58, 17 November 2023
  • AT91SAM7
    #Test if RAM is located at 0 using multiple read/write operations and testing the
    4 KB (530 words) - 14:22, 10 May 2024
  • STR91x
    ...ch brings MCU into Turbo Mode. "While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. The IOs are maintained
    1 KB (222 words) - 10:41, 27 April 2017
  • Generic IDE
    If sth. still does not work, we suggest as a first step to test if it has sth. to do with the IDE in use by checking if it works when using
    15 KB (2,318 words) - 15:30, 4 November 2021
  • J-Link script files
    // Output test values for <Keyfile>
    109 KB (15,505 words) - 08:38, 25 April 2024
  • Using J-Link VCOM functionality
    == Parity Test == The following setup is used for the partiy function test:
    7 KB (997 words) - 11:27, 22 November 2022
  • Bluefruit LE UART Friend
    # Turn off the power supply and flip the board. There you will find SWD test points.
    1 KB (164 words) - 14:31, 10 May 2024
  • SEGGER Flash Loader
    # Implement SEGGER_FL_Erase() and retry the flash download test. J-Link Commander should still report verify failed but effected flash memo ...nt SEGGER_FL_Program() and retry the flash download test. Expected result: Test reports O.K. --> Programmed successfully. If not, check SEGGER_FL_Program()
    24 KB (3,557 words) - 14:59, 20 November 2023
  • J-Link Remote Server
    The engineer at SEGGER can use J-Link Commander or a debugger to test and debug the new device without the need to have the device on the desk. To test whether a connection to the tunnel server can be established or not a netwo
    7 KB (984 words) - 16:27, 31 August 2023
  • DAP
    * JTAG-AP <span style="color:#a2a9b1">Joint Test Action Group- Access Port </span>
    7 KB (1,150 words) - 16:21, 13 July 2022
  • Knowledge Base
    * [[Test Farm]]
    2 KB (162 words) - 10:58, 23 January 2024
  • Debug Probes - J-Link & J-Trace
    *[[SEGGER Ozone#Automated_test_example|Automated test example]]
    16 KB (1,908 words) - 10:22, 8 May 2024
  • Automated Tests with Ozone
    For the automated test example that will be shown in this article the following minimum requiremen # Load test application
    3 KB (567 words) - 11:14, 8 September 2023
  • emRun
    This is the description for the test projects. The test projects have been designed to measure the performance of C library functio
    20 KB (1,808 words) - 10:13, 21 November 2022
  • CDC
    We have analysed this using a hardware [[USB analyser]] and a test program which The test application checks that the received packet always has the ID of the previo
    3 KB (429 words) - 17:27, 7 April 2022
  • cJTAG
    ...tands for Joint Test Action Group typically refers to a 4-pin interface to test, program and/or debug integrated circuits.
    309 bytes (46 words) - 09:31, 10 March 2023
  • J-Link Nickname
    ...ale setups where there are multiple J-Links connected to a PC for testing (test farms) etc.
    2 KB (264 words) - 17:11, 7 September 2023
  • J-Run
    It loads an application (elf) file to the device under test, runs it, and captures the application's output. == Test Applications ==
    3 KB (385 words) - 15:38, 29 June 2022
  • UM08001 J-Link / J-Trace User Guide
    ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality. ...uality" of code, as it shows how much code was executed while running in a test setup.
    92 KB (14,353 words) - 12:06, 7 March 2024
  • ATSAMD specifics
    When manually toggling the reset pin (e.g. in a production test), it is necessary to pull the SWCLK/TCK pin up, before releasing nRESET:
    405 bytes (67 words) - 17:51, 9 December 2019
  • J-Link RTT Viewer
    JLinkRTTViewer.exe --setwindowtitle "Test board #1234"
    21 KB (2,872 words) - 09:41, 4 March 2024
  • Cortex-M Fault
    A project to test the faults is available [[:File:CortexM_FaultTest.zip|here]]. === Exception Test Application ===
    47 KB (5,096 words) - 16:57, 26 June 2023
  • NXP JN5189-DK006
    ...tion board. The board supports different Upgrade boards. It can be used to test & verify QN9090 and JN5189 support.
    1 KB (169 words) - 15:15, 8 May 2024
  • UM08003 JFlash
    ...e test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi | Test > Test speed || Writes data of an specified size t
    72 KB (10,586 words) - 13:00, 25 March 2024
  • JTAGLoad
    ! Start of test ! End of test
    2 KB (323 words) - 22:06, 1 March 2021
  • J-Link STR91x Commander
    While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. ...nk STR91x Commander can be started with different command line options for test and automation purposes.
    6 KB (911 words) - 15:08, 12 May 2020
  • J-Link GDB Server
    < Arguments: test 0 1 2 arg0=4 > monitor setargs test 0 1 2 arg0=4
    63 KB (8,889 words) - 09:59, 29 November 2023
  • J-Link SWO Viewer
    ...Viewer can also be controlled from the command line if used in a automated test environment etc.
    13 KB (1,666 words) - 15:42, 24 October 2022
  • J-Flash SPI
    | Test > Generate test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi
    46 KB (6,804 words) - 10:32, 27 February 2023
  • Embedded Studio Library IO
    * Low-overhead test to determine if stream is valid. If stream
    12 KB (1,424 words) - 17:37, 1 April 2022
  • Network performance measurement
    ...''RTT''' ('''R'''ound '''T'''rip '''T'''ime) or by performing a throughput test using a common used protocol like TCP or UDP. Often this gets mistaken for ...nce of sending the PING-request is not of relevance for the result of this test.
    13 KB (2,041 words) - 10:10, 7 October 2021
  • Geehy APM32F103ZET6
    ...iously known as APEXMIC) APM32F103ZET6 evaluation board. It can be used to test & verify APM32F103xx device support.
    1 KB (159 words) - 15:16, 8 May 2024
  • Arduino Due
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (587 words) - 14:25, 10 May 2024
  • Arduino MKR WiFi 1010
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (649 words) - 14:25, 10 May 2024
  • Arduino Nano 33 BLE
    ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.
    4 KB (662 words) - 14:26, 10 May 2024
  • Arduino Nano 33 IOT
    ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.
    4 KB (659 words) - 14:26, 10 May 2024
  • ONSemi RSL10
    | Non-Volatile Record (NVR) 4 <br> (Manufacturing Test) || 1024 || 0x00081800 - 0x00080BFF
    1 KB (207 words) - 09:00, 9 June 2023
  • AutoChips ATC0113
    ...es specifics for the AutoChips ATC0113 evaluation board. It can be used to test & verify [[AutoChips AC7801x]] support.
    1 KB (147 words) - 15:18, 8 May 2024
  • Silicon Labs RS9116X-SB-EVK1
    ...s for the Silicon Labs RS9116X-SB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.
    679 bytes (104 words) - 15:19, 8 May 2024
  • Silicon Labs RS9116X-DB-EVK1
    ...s for the Silicon Labs RS9116X-DB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.
    679 bytes (104 words) - 15:20, 8 May 2024
  • Using embOS with X-CUBE-STL
    ...help users targeting functional safety up to IEC 61508 SIL2/SIL3. The self-test library can be used with embOS, embOS-MPU and embOS-Safe without any restri From the embOS perspective the ST self-test library is part of the user application code.
    628 bytes (96 words) - 15:34, 16 February 2021
  • GigaDevice GD32H759I-EVAL
    ...fics for the GigaDevice GD32H759I-EVAL evaluation board. It can be used to test & verify GD32H7 device support.
    642 bytes (98 words) - 15:20, 8 May 2024

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