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  • Ozone automated test example
    40 bytes (5 words) - 11:49, 20 May 2020
  • Test Farm
    == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an
    3 KB (521 words) - 22:52, 23 February 2024
  • ESWIN EMU32VL170 TEST BRD
    This article describes specifics for the ''ESWIN EMU32VL170 TEST BRD'' evaluation board.<br> ...dded Studio project wizard and runs out-of-the-box on the ESWIN EMU32VL170 TEST BRD.<br>It is a simple Hello World sample linked into the internal flash.<b
    899 bytes (141 words) - 08:52, 28 September 2023

Page text matches

  • J-Link Commander
    ! colspan="3" | Measurement and test commands <tt>SaveBin C:\Work\test.bin 0x0000000 0x100</tt>
    52 KB (6,653 words) - 12:04, 22 April 2024
  • J-Link cannot connect to the CPU
    ...he [[#OpenOCD | OpenOCD]] paragraph and continue with [[#Test_Connection | Test Connection]]. ==== Test Connection ====
    8 KB (1,261 words) - 18:34, 2 November 2023
  • Debug session does not start
    Test if flash download on your target device works with the J-Link Commander:
    282 bytes (42 words) - 08:05, 14 August 2015
  • Target Interface JTAG
    == Test access port (TAP) == JTAG defines a TAP (Test access port). The TAP is a general-purpose port that can
    5 KB (707 words) - 09:59, 30 August 2023
  • Target Interface SWD
    ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality, anyhow dayisy-chaining devices as via JTAG is not possible.
    2 KB (288 words) - 09:58, 30 August 2023
  • SPI Flash
    * No debug header needs to be populated, just some test pads of the SPI signals, J-Link can be connected to via needles etc.
    12 KB (1,976 words) - 16:38, 10 October 2023
  • J-Link Command Strings
    HSSLogFile = C:\Test.log It may only be used by specific customers for very specific test cases that needs the cache mechanisms to be disabled.
    77 KB (9,842 words) - 11:00, 11 April 2024
  • Renesas e²studio
    * Fill in the project name (eg. 'Test'). Click '''Next'''.
    2 KB (293 words) - 14:09, 8 October 2020
  • XMC4xxx series
    ...f the devíce to give it a fresh start or reboot it after enabling another test mode etc.<br> ...he chip into an unexpected more, causing unpredictable behavior during the test setup.
    4 KB (637 words) - 11:58, 17 November 2023
  • AT91SAM7
    #Test if RAM is located at 0 using multiple read/write operations and testing the
    4 KB (530 words) - 14:22, 10 May 2024
  • STR91x
    ...ch brings MCU into Turbo Mode. "While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. The IOs are maintained
    1 KB (222 words) - 10:41, 27 April 2017
  • Generic IDE
    If sth. still does not work, we suggest as a first step to test if it has sth. to do with the IDE in use by checking if it works when using
    15 KB (2,318 words) - 15:30, 4 November 2021
  • J-Link script files
    // Output test values for <Keyfile>
    109 KB (15,505 words) - 08:38, 25 April 2024
  • Using J-Link VCOM functionality
    == Parity Test == The following setup is used for the partiy function test:
    7 KB (997 words) - 11:27, 22 November 2022
  • Bluefruit LE UART Friend
    # Turn off the power supply and flip the board. There you will find SWD test points.
    1 KB (164 words) - 14:31, 10 May 2024
  • SEGGER Flash Loader
    # Implement SEGGER_FL_Erase() and retry the flash download test. J-Link Commander should still report verify failed but effected flash memo ...nt SEGGER_FL_Program() and retry the flash download test. Expected result: Test reports O.K. --> Programmed successfully. If not, check SEGGER_FL_Program()
    24 KB (3,557 words) - 14:59, 20 November 2023
  • J-Link Remote Server
    The engineer at SEGGER can use J-Link Commander or a debugger to test and debug the new device without the need to have the device on the desk. To test whether a connection to the tunnel server can be established or not a netwo
    7 KB (984 words) - 16:27, 31 August 2023
  • DAP
    * JTAG-AP <span style="color:#a2a9b1">Joint Test Action Group- Access Port </span>
    7 KB (1,150 words) - 16:21, 13 July 2022
  • Knowledge Base
    * [[Test Farm]]
    2 KB (162 words) - 10:58, 23 January 2024
  • Debug Probes - J-Link & J-Trace
    *[[SEGGER Ozone#Automated_test_example|Automated test example]]
    16 KB (1,908 words) - 10:22, 8 May 2024
  • Automated Tests with Ozone
    For the automated test example that will be shown in this article the following minimum requiremen # Load test application
    3 KB (567 words) - 11:14, 8 September 2023
  • emRun
    This is the description for the test projects. The test projects have been designed to measure the performance of C library functio
    20 KB (1,808 words) - 10:13, 21 November 2022
  • CDC
    We have analysed this using a hardware [[USB analyser]] and a test program which The test application checks that the received packet always has the ID of the previo
    3 KB (429 words) - 17:27, 7 April 2022
  • cJTAG
    ...tands for Joint Test Action Group typically refers to a 4-pin interface to test, program and/or debug integrated circuits.
    309 bytes (46 words) - 09:31, 10 March 2023
  • J-Link Nickname
    ...ale setups where there are multiple J-Links connected to a PC for testing (test farms) etc.
    2 KB (264 words) - 17:11, 7 September 2023
  • J-Run
    It loads an application (elf) file to the device under test, runs it, and captures the application's output. == Test Applications ==
    3 KB (385 words) - 15:38, 29 June 2022
  • UM08001 J-Link / J-Trace User Guide
    ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality. ...uality" of code, as it shows how much code was executed while running in a test setup.
    92 KB (14,353 words) - 12:06, 7 March 2024
  • ATSAMD specifics
    When manually toggling the reset pin (e.g. in a production test), it is necessary to pull the SWCLK/TCK pin up, before releasing nRESET:
    405 bytes (67 words) - 17:51, 9 December 2019
  • J-Link RTT Viewer
    JLinkRTTViewer.exe --setwindowtitle "Test board #1234"
    21 KB (2,872 words) - 09:41, 4 March 2024
  • Cortex-M Fault
    A project to test the faults is available [[:File:CortexM_FaultTest.zip|here]]. === Exception Test Application ===
    47 KB (5,096 words) - 16:57, 26 June 2023
  • NXP JN5189-DK006
    ...tion board. The board supports different Upgrade boards. It can be used to test & verify QN9090 and JN5189 support.
    1 KB (169 words) - 15:15, 8 May 2024
  • UM08003 JFlash
    ...e test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi | Test > Test speed || Writes data of an specified size t
    72 KB (10,586 words) - 13:00, 25 March 2024
  • JTAGLoad
    ! Start of test ! End of test
    2 KB (323 words) - 22:06, 1 March 2021
  • J-Link STR91x Commander
    While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. ...nk STR91x Commander can be started with different command line options for test and automation purposes.
    6 KB (911 words) - 15:08, 12 May 2020
  • J-Link GDB Server
    < Arguments: test 0 1 2 arg0=4 > monitor setargs test 0 1 2 arg0=4
    63 KB (8,889 words) - 09:59, 29 November 2023
  • J-Link SWO Viewer
    ...Viewer can also be controlled from the command line if used in a automated test environment etc.
    13 KB (1,666 words) - 15:42, 24 October 2022
  • J-Flash SPI
    | Test > Generate test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi
    46 KB (6,804 words) - 10:32, 27 February 2023
  • Embedded Studio Library IO
    * Low-overhead test to determine if stream is valid. If stream
    12 KB (1,424 words) - 17:37, 1 April 2022
  • Network performance measurement
    ...''RTT''' ('''R'''ound '''T'''rip '''T'''ime) or by performing a throughput test using a common used protocol like TCP or UDP. Often this gets mistaken for ...nce of sending the PING-request is not of relevance for the result of this test.
    13 KB (2,041 words) - 10:10, 7 October 2021
  • Geehy APM32F103ZET6
    ...iously known as APEXMIC) APM32F103ZET6 evaluation board. It can be used to test & verify APM32F103xx device support.
    1 KB (159 words) - 15:16, 8 May 2024
  • Arduino Due
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (587 words) - 14:25, 10 May 2024
  • Arduino MKR WiFi 1010
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (649 words) - 14:25, 10 May 2024
  • Arduino Nano 33 BLE
    ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.
    4 KB (662 words) - 14:26, 10 May 2024
  • Arduino Nano 33 IOT
    ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.
    4 KB (659 words) - 14:26, 10 May 2024
  • ONSemi RSL10
    | Non-Volatile Record (NVR) 4 <br> (Manufacturing Test) || 1024 || 0x00081800 - 0x00080BFF
    1 KB (207 words) - 09:00, 9 June 2023
  • AutoChips ATC0113
    ...es specifics for the AutoChips ATC0113 evaluation board. It can be used to test & verify [[AutoChips AC7801x]] support.
    1 KB (147 words) - 15:18, 8 May 2024
  • Silicon Labs RS9116X-SB-EVK1
    ...s for the Silicon Labs RS9116X-SB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.
    679 bytes (104 words) - 15:19, 8 May 2024
  • Silicon Labs RS9116X-DB-EVK1
    ...s for the Silicon Labs RS9116X-DB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.
    679 bytes (104 words) - 15:20, 8 May 2024
  • Using embOS with X-CUBE-STL
    ...help users targeting functional safety up to IEC 61508 SIL2/SIL3. The self-test library can be used with embOS, embOS-MPU and embOS-Safe without any restri From the embOS perspective the ST self-test library is part of the user application code.
    628 bytes (96 words) - 15:34, 16 February 2021
  • GigaDevice GD32H759I-EVAL
    ...fics for the GigaDevice GD32H759I-EVAL evaluation board. It can be used to test & verify GD32H7 device support.
    642 bytes (98 words) - 15:20, 8 May 2024
  • Renesas EK-RA6M5
    ...bes specifics for the Renesas EK-RA6M5 evaluation board. It can be used to test & verify [[Renesas RA6M5]] support.
    970 bytes (151 words) - 15:20, 8 May 2024
  • ONSemi RSL15
    | Non-Volatile Record (NVR) 7 <br> (Manufacturing Test) || 256 || 0x00080700 - 0x000807FF || {{YES}} | Non-Volatile Record (NVR) 7 <br> (Manufacturing Test) || 256 || 0x00080700 - 0x000807FF || {{YES}}
    4 KB (667 words) - 18:01, 22 September 2022
  • Reset and Halt After Bootloader
    ===Test & Verify functionality using J-Link Commander===
    4 KB (594 words) - 08:59, 9 July 2021
  • Renesas FPB-RA4E1
    ...es specifics for the Renesas FPB-RA4E1 evaluation board. It can be used to test & verify [[Renesas RA4E1]] support.
    974 bytes (151 words) - 15:23, 8 May 2024
  • Renesas FPB-RA6E1
    ...es specifics for the Renesas FPB-RA6E1 evaluation board. It can be used to test & verify [[Renesas RA6E1]] support.
    974 bytes (151 words) - 15:23, 8 May 2024
  • Renesas RZ/V2L
    ...nect sequence. After executing the sequence, the Cortex-M33 is executing a test loop in the SRAM. This way, the Cortex-M33 can be debugged out-of-the-box w
    788 bytes (119 words) - 16:47, 4 November 2021
  • NXP X-KW45B41Z
    ...tion board. The board supports different Upgrade boards. It can be used to test & verify NXP KW45 and NXP K32W14 support.
    1 KB (187 words) - 15:24, 8 May 2024
  • NXP S32K3X4EVB
    ...ribes specifics for the NXP S32K3X4EVB evaluation board. It can be used to test & verify S32K344 device support with J-Link.
    1 KB (195 words) - 15:24, 8 May 2024
  • HSXP HK32F030M
    ...specifics for the HSXP_HK32F030M/0301M evaluation board. It can be used to test & verify HK32F03xx series device support.
    1,002 bytes (164 words) - 15:25, 8 May 2024
  • HSXP HK32F030M/0301M
    ...specifics for the HSXP_HK32F030M/0301M evaluation board. It can be used to test & verify HK32F03xx series device support.
    1,002 bytes (164 words) - 15:25, 8 May 2024
  • SignatureServer
    ...ning, verification and signature compatibility to OpenSSL are part of that test suite. A number of different digests are tested for a number of different k ...and setup the network such that it can reach the running signature server. Test the connection (e.g. with <code>ping</code>). It is best practice to only h
    20 KB (3,305 words) - 17:56, 21 January 2022
  • NXP PNEV76FAMA
    ...ribes specifics for the NXP PNEV76FAMA evaluation board. It can be used to test & verify [[NXP PN76 |PN76]] device support with J-Link.
    1 KB (188 words) - 15:26, 8 May 2024
  • Renesas RZ/T2M-RSK
    ===Test Procedure===
    2 KB (296 words) - 15:26, 8 May 2024
  • Geehy APM32F030RCT6
    ...iously known as APEXMIC) APM32F030RCT6 evaluation board. It can be used to test & verify APM32F030xx device support.
    1 KB (162 words) - 15:26, 8 May 2024
  • Geehy APM32F051R8T6
    ...iously known as APEXMIC) APM32F051R8T6 evaluation board. It can be used to test & verify APM32F030xx device support.
    1 KB (168 words) - 15:30, 8 May 2024
  • Geehy APM32E103ZET6
    ...iously known as APEXMIC) APM32E103ZET6 evaluation board. It can be used to test & verify APM32E103xx device support.
    1 KB (162 words) - 15:30, 8 May 2024
  • Geehy APM32F003F6P6
    ...iously known as APEXMIC) APM32F003F6P6 evaluation board. It can be used to test & verify APM32F003xx device support.
    1 KB (168 words) - 15:32, 8 May 2024
  • Geehy APM32F072VBT6
    ...iously known as APEXMIC) APM32F072VBT6 evaluation board. It can be used to test & verify APM32F072xx device support.
    1 KB (162 words) - 15:32, 8 May 2024
  • Geehy APM32F091VCT6
    ...iously known as APEXMIC) APM32F091VCT6 evaluation board. It can be used to test & verify APM32F091xx device support.
    1 KB (162 words) - 15:32, 8 May 2024
  • Geehy APM32F407VGT6
    ...iously known as APEXMIC) APM32F407VGT6 evaluation board. It can be used to test & verify APM32F4xx device support.
    1 KB (162 words) - 15:32, 8 May 2024
  • emRun++
    This is the source listing for the test projects.
    3 KB (447 words) - 16:59, 28 July 2022
  • Synchronizing multiple instances of embOS on a multi-core processor
    ...() calls in one or both applications and let the applications run again to test it yourself.
    11 KB (1,700 words) - 11:00, 3 August 2022
  • TMPM4
    ...do not recommend this eval board, even though trace was working fine under test conditions.
    8 KB (1,337 words) - 16:47, 4 August 2023
  • Renesas RZ/N2L-RSK
    ===Test Procedure===
    2 KB (299 words) - 15:33, 8 May 2024
  • How to create a custom ESPRO BSP
    #To test emNet create a new c source file with following content:
    15 KB (1,892 words) - 08:51, 22 August 2022
  • ONSemi RSL15-EVB
    This article describes specifics for the ONSemi RSL15-EVB. It can be used to test & verify RSL15 support.
    1 KB (232 words) - 15:33, 8 May 2024
  • Qorvo PAC5532EVK1
    ...pecifics for the Qorvo PAC5532EVK1 development platform. It can be used to test & verify PAC55xx device support.
    1 KB (166 words) - 15:33, 8 May 2024
  • NXP MIMXRT1060-EVK
    ...s specifics for the NXP MIMXRT1060-EVK evaluation board. It can be used to test & verify NXP [[i.MXRT1060]] support.
    2 KB (241 words) - 15:34, 8 May 2024
  • TI LP-MSPM0G3507
    It can be used to test & verify MSPM0G device support.
    1 KB (188 words) - 15:35, 8 May 2024
  • TI LP-MSPM0L1306
    It can be used to test & verify MSPM0L device support.
    1 KB (170 words) - 15:35, 8 May 2024
  • NXP PNEV7642A
    ...cribes specifics for the NXP PNEV7642A evaluation board. It can be used to test & verify [[NXP PN76 |PN76]] device support with J-Link.
    1 KB (166 words) - 15:35, 8 May 2024
  • J-Link Eco mode
    For large test farms or similar, it may make sense to configure the J-Links for a higher E
    541 bytes (93 words) - 10:21, 14 December 2022
  • NXP MIMXRT1060-EVKC
    It can be used to test & verify NXP [[i.MXRT1060]] support.
    2 KB (272 words) - 15:36, 8 May 2024
  • Setting up IP network interface
    * To test the IP connection J-Link Commander from the J-Link software install folder
    8 KB (1,318 words) - 11:48, 25 April 2024
  • HPMicro HPM6200EVK
    ...s specifics for the HPMicro HPM6200EVK evaluation board. It can be used to test & verify HPM62xx device support.
    1 KB (156 words) - 11:04, 13 April 2023
  • FlasherControl
    ...Flasher Hub for all connected devices &mdash; control by an automation or test computer is sometimes not easy.
    7 KB (1,090 words) - 08:58, 11 August 2023
  • CVA BlueWhale CVM0118-EVK
    ...fics for the CVA BlueWhale CVM0118-EVK evaluation board. It can be used to test & verify CVM011x device support.
    1 KB (174 words) - 14:33, 10 May 2024
  • Flasher/FAQ
    ...st. It is only necessary to ''command'' the flasher. This may simplify the test program. * Configuration program does not need to be part of test controller.
    8 KB (1,336 words) - 12:35, 8 December 2023
  • Arduino Giga R1 WiFi
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (632 words) - 14:25, 10 May 2024
  • Test Farm
    == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an
    3 KB (521 words) - 22:52, 23 February 2024
  • TI LP-EM-CC2340R5
    ...example application contains a small blinky application and can be used to test & verify flash programming functionality on the TI LP-EM-CC2340R5 evaluatio
    879 bytes (138 words) - 09:53, 17 May 2023
  • SemiDrive SD126 E3205 LQFP144 DEV KIT
    ...specifics for the SemiDrive SD126_E3205_LQFP144_DEV_KIT. It can be used to test & verify E32xx device support.
    657 bytes (103 words) - 13:54, 24 May 2023
  • 20-pin J-Link Connector
    | '''11''' || RTCK || Input || Return test clock signal from the target.<br>Some targets must synchronize the JTAG inp
    17 KB (2,764 words) - 11:02, 4 January 2024
  • Stack Overflow Prevention
    An Embedded Studio solution to test and run the examples is available: [[Media:STOP_Examples.zip|STOP Examples]
    26 KB (3,318 words) - 14:42, 17 August 2023
  • Arduino MKR WAN 1310
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (657 words) - 14:25, 10 May 2024
  • Flasher Hub
    The Flasher Hub has been designed to be used in conjunction with automated test equipment (ATE).
    5 KB (713 words) - 16:15, 6 May 2024
  • Flasher Hub - Getting started
    ...nal interface or handshake interface connection between the ATE (Automated Test Equipment) and the Flasher Hub, flash programming operations can be trigger
    15 KB (2,345 words) - 16:02, 6 May 2024
  • NXP 8MNANOLPD4-EVK
    It can be used to test & verify NXP iMX 8M Nano device support for Cortex-M7.
    1 KB (223 words) - 09:33, 5 April 2024
  • NXP 8MMINILPD4-EVKB
    It can be used to test & verify NXP iMX 8M Mini device support for Cortex-M4.
    1 KB (223 words) - 09:43, 5 April 2024
  • NXP 8MPLUSLPD4 EVK
    It can be used to test & verify NXP iMX 8M Plus device support for Cortex-M7.
    1 KB (223 words) - 09:51, 5 April 2024

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