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  • Ozone automated test example
    40 bytes (5 words) - 11:49, 20 May 2020
  • Test Farm
    == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an
    3 KB (521 words) - 22:52, 23 February 2024
  • ESWIN EMU32VL170 TEST BRD
    This article describes specifics for the ''ESWIN EMU32VL170 TEST BRD'' evaluation board.<br> ...dded Studio project wizard and runs out-of-the-box on the ESWIN EMU32VL170 TEST BRD.<br>It is a simple Hello World sample linked into the internal flash.<b
    899 bytes (141 words) - 08:52, 28 September 2023

Page text matches

  • J-Link Commander
    ! colspan="3" | Measurement and test commands <tt>SaveBin C:\Work\test.bin 0x0000000 0x100</tt>
    52 KB (6,653 words) - 12:04, 22 April 2024
  • J-Link cannot connect to the CPU
    ...he [[#OpenOCD | OpenOCD]] paragraph and continue with [[#Test_Connection | Test Connection]]. ==== Test Connection ====
    8 KB (1,261 words) - 18:34, 2 November 2023
  • Debug session does not start
    Test if flash download on your target device works with the J-Link Commander:
    282 bytes (42 words) - 08:05, 14 August 2015
  • Target Interface JTAG
    == Test access port (TAP) == JTAG defines a TAP (Test access port). The TAP is a general-purpose port that can
    5 KB (707 words) - 09:59, 30 August 2023
  • Target Interface SWD
    ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality, anyhow dayisy-chaining devices as via JTAG is not possible.
    2 KB (288 words) - 09:58, 30 August 2023
  • SPI Flash
    * No debug header needs to be populated, just some test pads of the SPI signals, J-Link can be connected to via needles etc.
    12 KB (1,976 words) - 16:38, 10 October 2023
  • J-Link Command Strings
    HSSLogFile = C:\Test.log It may only be used by specific customers for very specific test cases that needs the cache mechanisms to be disabled.
    77 KB (9,842 words) - 11:00, 11 April 2024
  • Renesas e²studio
    * Fill in the project name (eg. 'Test'). Click '''Next'''.
    2 KB (293 words) - 14:09, 8 October 2020
  • XMC4xxx series
    ...f the devíce to give it a fresh start or reboot it after enabling another test mode etc.<br> ...he chip into an unexpected more, causing unpredictable behavior during the test setup.
    4 KB (637 words) - 11:58, 17 November 2023
  • AT91SAM7
    #Test if RAM is located at 0 using multiple read/write operations and testing the
    4 KB (530 words) - 14:22, 10 May 2024
  • STR91x
    ...ch brings MCU into Turbo Mode. "While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. The IOs are maintained
    1 KB (222 words) - 10:41, 27 April 2017
  • Generic IDE
    If sth. still does not work, we suggest as a first step to test if it has sth. to do with the IDE in use by checking if it works when using
    15 KB (2,318 words) - 15:30, 4 November 2021
  • J-Link script files
    // Output test values for <Keyfile>
    109 KB (15,505 words) - 08:38, 25 April 2024
  • Using J-Link VCOM functionality
    == Parity Test == The following setup is used for the partiy function test:
    7 KB (997 words) - 11:27, 22 November 2022
  • Bluefruit LE UART Friend
    # Turn off the power supply and flip the board. There you will find SWD test points.
    1 KB (164 words) - 14:31, 10 May 2024
  • SEGGER Flash Loader
    # Implement SEGGER_FL_Erase() and retry the flash download test. J-Link Commander should still report verify failed but effected flash memo ...nt SEGGER_FL_Program() and retry the flash download test. Expected result: Test reports O.K. --> Programmed successfully. If not, check SEGGER_FL_Program()
    24 KB (3,557 words) - 14:59, 20 November 2023
  • J-Link Remote Server
    The engineer at SEGGER can use J-Link Commander or a debugger to test and debug the new device without the need to have the device on the desk. To test whether a connection to the tunnel server can be established or not a netwo
    7 KB (984 words) - 16:27, 31 August 2023
  • DAP
    * JTAG-AP <span style="color:#a2a9b1">Joint Test Action Group- Access Port </span>
    7 KB (1,150 words) - 16:21, 13 July 2022
  • Knowledge Base
    * [[Test Farm]]
    2 KB (162 words) - 10:58, 23 January 2024
  • Debug Probes - J-Link & J-Trace
    *[[SEGGER Ozone#Automated_test_example|Automated test example]]
    16 KB (1,908 words) - 10:22, 8 May 2024
  • Automated Tests with Ozone
    For the automated test example that will be shown in this article the following minimum requiremen # Load test application
    3 KB (567 words) - 11:14, 8 September 2023
  • emRun
    This is the description for the test projects. The test projects have been designed to measure the performance of C library functio
    20 KB (1,808 words) - 10:13, 21 November 2022
  • CDC
    We have analysed this using a hardware [[USB analyser]] and a test program which The test application checks that the received packet always has the ID of the previo
    3 KB (429 words) - 17:27, 7 April 2022
  • cJTAG
    ...tands for Joint Test Action Group typically refers to a 4-pin interface to test, program and/or debug integrated circuits.
    309 bytes (46 words) - 09:31, 10 March 2023
  • J-Link Nickname
    ...ale setups where there are multiple J-Links connected to a PC for testing (test farms) etc.
    2 KB (264 words) - 17:11, 7 September 2023
  • J-Run
    It loads an application (elf) file to the device under test, runs it, and captures the application's output. == Test Applications ==
    3 KB (385 words) - 15:38, 29 June 2022
  • UM08001 J-Link / J-Trace User Guide
    ...e bi-directional data pin (SWDIO), providing all the normal JTAG debug and test functionality. ...uality" of code, as it shows how much code was executed while running in a test setup.
    92 KB (14,353 words) - 12:06, 7 March 2024
  • ATSAMD specifics
    When manually toggling the reset pin (e.g. in a production test), it is necessary to pull the SWCLK/TCK pin up, before releasing nRESET:
    405 bytes (67 words) - 17:51, 9 December 2019
  • J-Link RTT Viewer
    JLinkRTTViewer.exe --setwindowtitle "Test board #1234"
    21 KB (2,872 words) - 09:41, 4 March 2024
  • Cortex-M Fault
    A project to test the faults is available [[:File:CortexM_FaultTest.zip|here]]. === Exception Test Application ===
    47 KB (5,096 words) - 16:57, 26 June 2023
  • NXP JN5189-DK006
    ...tion board. The board supports different Upgrade boards. It can be used to test & verify QN9090 and JN5189 support.
    1 KB (169 words) - 15:15, 8 May 2024
  • UM08003 JFlash
    ...e test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi | Test > Test speed || Writes data of an specified size t
    72 KB (10,586 words) - 13:00, 25 March 2024
  • JTAGLoad
    ! Start of test ! End of test
    2 KB (323 words) - 22:06, 1 March 2021
  • J-Link STR91x Commander
    While enabling the Turbo Mode, a dedicated test mode signal is set and controls the GPIOs in output. ...nk STR91x Commander can be started with different command line options for test and automation purposes.
    6 KB (911 words) - 15:08, 12 May 2020
  • J-Link GDB Server
    < Arguments: test 0 1 2 arg0=4 > monitor setargs test 0 1 2 arg0=4
    63 KB (8,889 words) - 09:59, 29 November 2023
  • J-Link SWO Viewer
    ...Viewer can also be controlled from the command line if used in a automated test environment etc.
    13 KB (1,666 words) - 15:42, 24 October 2022
  • J-Flash SPI
    | Test > Generate test data || Generates data which can be used to test if the flash can be programmed correctly. The size of the generated data fi
    46 KB (6,804 words) - 10:32, 27 February 2023
  • Embedded Studio Library IO
    * Low-overhead test to determine if stream is valid. If stream
    12 KB (1,424 words) - 17:37, 1 April 2022
  • Network performance measurement
    ...''RTT''' ('''R'''ound '''T'''rip '''T'''ime) or by performing a throughput test using a common used protocol like TCP or UDP. Often this gets mistaken for ...nce of sending the PING-request is not of relevance for the result of this test.
    13 KB (2,041 words) - 10:10, 7 October 2021
  • Geehy APM32F103ZET6
    ...iously known as APEXMIC) APM32F103ZET6 evaluation board. It can be used to test & verify APM32F103xx device support.
    1 KB (159 words) - 15:16, 8 May 2024
  • Arduino Due
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (587 words) - 14:25, 10 May 2024
  • Arduino MKR WiFi 1010
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (649 words) - 14:25, 10 May 2024
  • Arduino Nano 33 BLE
    ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.
    4 KB (662 words) - 14:26, 10 May 2024
  • Arduino Nano 33 IOT
    ...ce connector, but the required connections are exposed on the back side on test points as follows: ...w the necessary cables just need to be stripped and can be soldered to the test points.
    4 KB (659 words) - 14:26, 10 May 2024
  • ONSemi RSL10
    | Non-Volatile Record (NVR) 4 <br> (Manufacturing Test) || 1024 || 0x00081800 - 0x00080BFF
    1 KB (207 words) - 09:00, 9 June 2023
  • AutoChips ATC0113
    ...es specifics for the AutoChips ATC0113 evaluation board. It can be used to test & verify [[AutoChips AC7801x]] support.
    1 KB (147 words) - 15:18, 8 May 2024
  • Silicon Labs RS9116X-SB-EVK1
    ...s for the Silicon Labs RS9116X-SB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.
    679 bytes (104 words) - 15:19, 8 May 2024
  • Silicon Labs RS9116X-DB-EVK1
    ...s for the Silicon Labs RS9116X-DB-EVK1 evaluation board. It can be used to test & verify [[Silicon_Labs_RS9116 | Silicon Labs RS9116]] support.
    679 bytes (104 words) - 15:20, 8 May 2024
  • Using embOS with X-CUBE-STL
    ...help users targeting functional safety up to IEC 61508 SIL2/SIL3. The self-test library can be used with embOS, embOS-MPU and embOS-Safe without any restri From the embOS perspective the ST self-test library is part of the user application code.
    628 bytes (96 words) - 15:34, 16 February 2021
  • GigaDevice GD32H759I-EVAL
    ...fics for the GigaDevice GD32H759I-EVAL evaluation board. It can be used to test & verify GD32H7 device support.
    642 bytes (98 words) - 15:20, 8 May 2024
  • Renesas EK-RA6M5
    ...bes specifics for the Renesas EK-RA6M5 evaluation board. It can be used to test & verify [[Renesas RA6M5]] support.
    970 bytes (151 words) - 15:20, 8 May 2024
  • ONSemi RSL15
    | Non-Volatile Record (NVR) 7 <br> (Manufacturing Test) || 256 || 0x00080700 - 0x000807FF || {{YES}} | Non-Volatile Record (NVR) 7 <br> (Manufacturing Test) || 256 || 0x00080700 - 0x000807FF || {{YES}}
    4 KB (667 words) - 18:01, 22 September 2022
  • Reset and Halt After Bootloader
    ===Test & Verify functionality using J-Link Commander===
    4 KB (594 words) - 08:59, 9 July 2021
  • Renesas FPB-RA4E1
    ...es specifics for the Renesas FPB-RA4E1 evaluation board. It can be used to test & verify [[Renesas RA4E1]] support.
    974 bytes (151 words) - 15:23, 8 May 2024
  • Renesas FPB-RA6E1
    ...es specifics for the Renesas FPB-RA6E1 evaluation board. It can be used to test & verify [[Renesas RA6E1]] support.
    974 bytes (151 words) - 15:23, 8 May 2024
  • Renesas RZ/V2L
    ...nect sequence. After executing the sequence, the Cortex-M33 is executing a test loop in the SRAM. This way, the Cortex-M33 can be debugged out-of-the-box w
    788 bytes (119 words) - 16:47, 4 November 2021
  • NXP X-KW45B41Z
    ...tion board. The board supports different Upgrade boards. It can be used to test & verify NXP KW45 and NXP K32W14 support.
    1 KB (187 words) - 15:24, 8 May 2024
  • NXP S32K3X4EVB
    ...ribes specifics for the NXP S32K3X4EVB evaluation board. It can be used to test & verify S32K344 device support with J-Link.
    1 KB (195 words) - 15:24, 8 May 2024
  • HSXP HK32F030M
    ...specifics for the HSXP_HK32F030M/0301M evaluation board. It can be used to test & verify HK32F03xx series device support.
    1,002 bytes (164 words) - 15:25, 8 May 2024
  • HSXP HK32F030M/0301M
    ...specifics for the HSXP_HK32F030M/0301M evaluation board. It can be used to test & verify HK32F03xx series device support.
    1,002 bytes (164 words) - 15:25, 8 May 2024
  • SignatureServer
    ...ning, verification and signature compatibility to OpenSSL are part of that test suite. A number of different digests are tested for a number of different k ...and setup the network such that it can reach the running signature server. Test the connection (e.g. with <code>ping</code>). It is best practice to only h
    20 KB (3,305 words) - 17:56, 21 January 2022
  • NXP PNEV76FAMA
    ...ribes specifics for the NXP PNEV76FAMA evaluation board. It can be used to test & verify [[NXP PN76 |PN76]] device support with J-Link.
    1 KB (188 words) - 15:26, 8 May 2024
  • Renesas RZ/T2M-RSK
    ===Test Procedure===
    2 KB (296 words) - 15:26, 8 May 2024
  • Geehy APM32F030RCT6
    ...iously known as APEXMIC) APM32F030RCT6 evaluation board. It can be used to test & verify APM32F030xx device support.
    1 KB (162 words) - 15:26, 8 May 2024
  • Geehy APM32F051R8T6
    ...iously known as APEXMIC) APM32F051R8T6 evaluation board. It can be used to test & verify APM32F030xx device support.
    1 KB (168 words) - 15:30, 8 May 2024
  • Geehy APM32E103ZET6
    ...iously known as APEXMIC) APM32E103ZET6 evaluation board. It can be used to test & verify APM32E103xx device support.
    1 KB (162 words) - 15:30, 8 May 2024
  • Geehy APM32F003F6P6
    ...iously known as APEXMIC) APM32F003F6P6 evaluation board. It can be used to test & verify APM32F003xx device support.
    1 KB (168 words) - 15:32, 8 May 2024
  • Geehy APM32F072VBT6
    ...iously known as APEXMIC) APM32F072VBT6 evaluation board. It can be used to test & verify APM32F072xx device support.
    1 KB (162 words) - 15:32, 8 May 2024
  • Geehy APM32F091VCT6
    ...iously known as APEXMIC) APM32F091VCT6 evaluation board. It can be used to test & verify APM32F091xx device support.
    1 KB (162 words) - 15:32, 8 May 2024
  • Geehy APM32F407VGT6
    ...iously known as APEXMIC) APM32F407VGT6 evaluation board. It can be used to test & verify APM32F4xx device support.
    1 KB (162 words) - 15:32, 8 May 2024
  • emRun++
    This is the source listing for the test projects.
    3 KB (447 words) - 16:59, 28 July 2022
  • Synchronizing multiple instances of embOS on a multi-core processor
    ...() calls in one or both applications and let the applications run again to test it yourself.
    11 KB (1,700 words) - 11:00, 3 August 2022
  • TMPM4
    ...do not recommend this eval board, even though trace was working fine under test conditions.
    8 KB (1,337 words) - 16:47, 4 August 2023
  • Renesas RZ/N2L-RSK
    ===Test Procedure===
    2 KB (299 words) - 15:33, 8 May 2024
  • How to create a custom ESPRO BSP
    #To test emNet create a new c source file with following content:
    15 KB (1,892 words) - 08:51, 22 August 2022
  • ONSemi RSL15-EVB
    This article describes specifics for the ONSemi RSL15-EVB. It can be used to test & verify RSL15 support.
    1 KB (232 words) - 15:33, 8 May 2024
  • Qorvo PAC5532EVK1
    ...pecifics for the Qorvo PAC5532EVK1 development platform. It can be used to test & verify PAC55xx device support.
    1 KB (166 words) - 15:33, 8 May 2024
  • NXP MIMXRT1060-EVK
    ...s specifics for the NXP MIMXRT1060-EVK evaluation board. It can be used to test & verify NXP [[i.MXRT1060]] support.
    2 KB (241 words) - 15:34, 8 May 2024
  • TI LP-MSPM0G3507
    It can be used to test & verify MSPM0G device support.
    1 KB (188 words) - 15:35, 8 May 2024
  • TI LP-MSPM0L1306
    It can be used to test & verify MSPM0L device support.
    1 KB (170 words) - 15:35, 8 May 2024
  • NXP PNEV7642A
    ...cribes specifics for the NXP PNEV7642A evaluation board. It can be used to test & verify [[NXP PN76 |PN76]] device support with J-Link.
    1 KB (166 words) - 15:35, 8 May 2024
  • J-Link Eco mode
    For large test farms or similar, it may make sense to configure the J-Links for a higher E
    541 bytes (93 words) - 10:21, 14 December 2022
  • NXP MIMXRT1060-EVKC
    It can be used to test & verify NXP [[i.MXRT1060]] support.
    2 KB (272 words) - 15:36, 8 May 2024
  • Setting up IP network interface
    * To test the IP connection J-Link Commander from the J-Link software install folder
    8 KB (1,318 words) - 11:48, 25 April 2024
  • HPMicro HPM6200EVK
    ...s specifics for the HPMicro HPM6200EVK evaluation board. It can be used to test & verify HPM62xx device support.
    1 KB (156 words) - 11:04, 13 April 2023
  • FlasherControl
    ...Flasher Hub for all connected devices &mdash; control by an automation or test computer is sometimes not easy.
    7 KB (1,090 words) - 08:58, 11 August 2023
  • CVA BlueWhale CVM0118-EVK
    ...fics for the CVA BlueWhale CVM0118-EVK evaluation board. It can be used to test & verify CVM011x device support.
    1 KB (174 words) - 14:33, 10 May 2024
  • Flasher/FAQ
    ...st. It is only necessary to ''command'' the flasher. This may simplify the test program. * Configuration program does not need to be part of test controller.
    8 KB (1,336 words) - 12:35, 8 December 2023
  • Arduino Giga R1 WiFi
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (632 words) - 14:25, 10 May 2024
  • Test Farm
    == What is a test farm? == A "Test Farm” (sometimes also called “board farm” or “device farm”) in an
    3 KB (521 words) - 22:52, 23 February 2024
  • TI LP-EM-CC2340R5
    ...example application contains a small blinky application and can be used to test & verify flash programming functionality on the TI LP-EM-CC2340R5 evaluatio
    879 bytes (138 words) - 09:53, 17 May 2023
  • SemiDrive SD126 E3205 LQFP144 DEV KIT
    ...specifics for the SemiDrive SD126_E3205_LQFP144_DEV_KIT. It can be used to test & verify E32xx device support.
    657 bytes (103 words) - 13:54, 24 May 2023
  • 20-pin J-Link Connector
    | '''11''' || RTCK || Input || Return test clock signal from the target.<br>Some targets must synchronize the JTAG inp
    17 KB (2,764 words) - 11:02, 4 January 2024
  • Stack Overflow Prevention
    An Embedded Studio solution to test and run the examples is available: [[Media:STOP_Examples.zip|STOP Examples]
    26 KB (3,318 words) - 14:42, 17 August 2023
  • Arduino MKR WAN 1310
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (657 words) - 14:25, 10 May 2024
  • Flasher Hub
    The Flasher Hub has been designed to be used in conjunction with automated test equipment (ATE).
    5 KB (713 words) - 16:15, 6 May 2024
  • Flasher Hub - Getting started
    ...nal interface or handshake interface connection between the ATE (Automated Test Equipment) and the Flasher Hub, flash programming operations can be trigger
    15 KB (2,345 words) - 16:02, 6 May 2024
  • NXP 8MNANOLPD4-EVK
    It can be used to test & verify NXP iMX 8M Nano device support for Cortex-M7.
    1 KB (223 words) - 09:33, 5 April 2024
  • NXP 8MMINILPD4-EVKB
    It can be used to test & verify NXP iMX 8M Mini device support for Cortex-M4.
    1 KB (223 words) - 09:43, 5 April 2024
  • NXP 8MPLUSLPD4 EVK
    It can be used to test & verify NXP iMX 8M Plus device support for Cortex-M7.
    1 KB (223 words) - 09:51, 5 April 2024
  • NXP MCIMX8DXL-WEVK
    It can be used to test & verify NXP iMX 8 XLite device support for Cortex-M4.
    1 KB (217 words) - 10:31, 5 April 2024
  • NXP MCIMX8QXP-CPU
    It can be used to test & verify NXP iMX 8 X device support for Cortex-M4.
    1 KB (214 words) - 10:31, 5 April 2024
  • NXP MCIMX8QM-CPU
    It can be used to test & verify NXP iMX 8 X device support for Cortex-M4.
    1 KB (214 words) - 16:28, 5 April 2024
  • NXP MCIMX8M-EVKB
    It can be used to test & verify NXP iMX 8M Nano device support for Cortex-M7.
    1 KB (224 words) - 16:46, 5 April 2024
  • TI LP-MSPM0L2228
    It can be used to test & verify MSPM0Lx228 device support.
    1 KB (168 words) - 11:00, 10 April 2024
  • NuvoTon NuMaker-EVB-KM1M7
    It can be used to test & verify NuvoTon KM1M7AF device support.
    5 KB (743 words) - 16:50, 7 May 2024
  • NuvoTon NuMaker-EVB-KM1M4B
    It can be used to test & verify NuvoTon KM1M4BF device support.
    5 KB (749 words) - 16:55, 7 May 2024
  • Flasher/How to read data from a device using U-Flash
    ...tween <code>''Generate data file for read...''</code> and <code>''Generate test data file...''</code> is that when generating a ''data file for read'', fla ...ermore, in the ''data file for read'' all data is set to 1's whereas the ''test data file'' contains random data.
    13 KB (2,648 words) - 15:01, 11 August 2023
  • UM08022 Flasher
    DataFile = "TEST.dat" ConfigFile = "Test.cfg"
    155 KB (23,284 words) - 08:54, 3 April 2024
  • Arduino Uno R4 Minima
    * Connect your board to a J-Link as explained above and test the connection with J-Link Commander.
    4 KB (594 words) - 14:26, 10 May 2024
  • STM32-SFI Flasher Commander
    Firmware identifier: Test.
    5 KB (700 words) - 18:04, 13 November 2023
  • HPMicro HPM5300EVK
    ...s specifics for the HPMicro HPM5300EVK evaluation board. It can be used to test & verify HPM53xx device support.
    648 bytes (100 words) - 11:15, 13 September 2023
  • CVA BlueWhale CVM0146-EVB
    ...fics for the CVA BlueWhale CVM0146-EVB evaluation board. It can be used to test & verify CVM014x device support.
    745 bytes (112 words) - 14:34, 10 May 2024
  • ESWIN
    || <!--evalboard-->[[ESWIN_EMU32VL170_TEST_BRD|EMU32VL170 TEST BRD]]
    617 bytes (72 words) - 10:18, 28 September 2023
  • ESWIN EMU32VL170
    *ESWIN EMU32VL170 TEST BRD evaluation board: [[ESWIN EMU32VL170 TEST BRD]] *ESWIN EMU32VL170 TEST BRD evaluation board: [[ESWIN EMU32VL170 TEST BRD#Example_Project]]
    823 bytes (108 words) - 11:18, 10 October 2023
  • ESWIN EMU32VL170 TEST BRD
    This article describes specifics for the ''ESWIN EMU32VL170 TEST BRD'' evaluation board.<br> ...dded Studio project wizard and runs out-of-the-box on the ESWIN EMU32VL170 TEST BRD.<br>It is a simple Hello World sample linked into the internal flash.<b
    899 bytes (141 words) - 08:52, 28 September 2023
  • UM08039 Flasher Hub
    The Flasher Hub has been designed to be used in conjunction with automated test equipment (ATE). Via a Telnet connection between the ATE (Automated Test Equipment) and the Flasher Hub, flash programming operations can be trigger
    67 KB (9,981 words) - 17:19, 3 November 2023
  • Continuous Integration
    ...ed into the simulation, allowing for controlled execution and reporting of test results. ...are then executed on the hardware, with results (such as OK or not OK) and test details reported through the debug interface.
    5 KB (792 words) - 16:00, 20 October 2023
  • AICH ECBMCU105H
    ...ibes specifics for the AICH ECBMCU105H evaluation board. It can be used to test & verify 306xH device support.
    695 bytes (109 words) - 14:21, 10 May 2024
  • HowTo Measure CPU Performance
    This performance test runs with and without an RTOS. Please find below both applications.
    10 KB (1,116 words) - 17:50, 17 November 2023
  • TI LP-MSPM0C1104
    It can be used to test & verify MSPM0C device support.
    2 KB (289 words) - 18:04, 30 November 2023
  • Flasher/How to use WireCheck
    The test is executed very fast. If all test sequences PASS the test ends with an Ok message. If the WireCheck was successful, the next test should be to "talk" to the device.
    7 KB (1,050 words) - 15:04, 19 December 2023
  • Flasher/Glossary
    ;<span id="Functional Circuit Test (FCT)">Functional Circuit Test (FCT)</span> :The last test for fully assembled PCBs, assessing overall functionality by subjecting the
    6 KB (997 words) - 16:24, 12 March 2024
  • Microchip CuriosityUltra PIC32CZCA80
    It can be used to test & verify PIC32CZCA80 device support.
    1 KB (157 words) - 16:49, 13 December 2023
  • Microchip CuriosityUltra PIC32CZCA90
    It can be used to test & verify PIC32CZCA90 device support.
    1 KB (157 words) - 16:49, 13 December 2023
  • HPMicro HPM6800EVK
    ...s specifics for the HPMicro HPM6800EVK evaluation board. It can be used to test & verify HPM68xx device support.
    643 bytes (99 words) - 08:54, 7 February 2024
  • Geehy G32A1145 EVAL
    ...iously known as APEXMIC) G32A1145 EVAL evaluation board. It can be used to test & verify G32A1xx device support.
    633 bytes (100 words) - 09:35, 7 February 2024
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